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A tomographic approach to inverse mie particle characterization from scattered light

Posted Fri, 07/10/2009 - 14:42 by paul
TitleA tomographic approach to inverse mie particle characterization from scattered light
Publication TypeJournal Article
Year of Publication2007
AuthorsJaffe, JS
JournalOptics Express
Volume15
Pagination12217–12229
KeywordsImage reconstruction techniques Inverse scattering Mie theory Tomography
URLhttp://www.opticsexpress.org/abstract.cfm?URI=oe-15-19-12217
Citation KeyJaffe2007
AttachmentSize
Jaffe_Mierecon_Optexp.pdf280.72 KB
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